JEDEC JESD659B

FAILURE-MECHANISM-DRIVEN RELIABILITY MONITORING
standard by JEDEC Solid State Technology Association, 02/01/2007

JEDEC JESD217

TEST METHODS TO CHARACTERIZE VOIDING IN PRE-SMT BALL GRID ARRAY PACKAGES
standard by JEDEC Solid State Technology Association, 09/01/2010

JEDEC JESD90

A PROCEDURE FOR MEASURING P-CHANNEL MOSFET NEGATIVE BIAS TEMPERATURE INSTABILITIES
standard by JEDEC Solid State Technology Association, 11/01/2004

JEDEC JESD245C

Byte Addressable Energy Backed Interface
standard by JEDEC Solid State Technology Association, 09/01/2019

JEDEC JESD57

TEST PROCEDURE FOR THE MANAGEMENT OF SINGLE-EVENT EFFECTS IN SEMICONDUCTOR DEVICES FROM HEAVY ION IRRADIATION
standard by JEDEC Solid State Technology Association, 12/01/1996

JEDEC JESD16-A (R2008)

ASSESSMENT OF AVERAGE OUTGOING QUALITY LEVELS IN PARTS PER MILLION (PPM)
standard by JEDEC Solid State Technology Association, 04/01/1995

JEDEC JESD84-C43

EMBEDDED MULTIMEDIACARD (e*MMC)MECHANICAL STANDARD
standard by JEDEC Solid State Technology Association, 12/01/2007

JEDEC JESD82-31

DDR4 REGISTER CLOCK DRIVER (DDR4RCD01)
standard by JEDEC Solid State Technology Association, 08/01/2016

JEDEC JESD22-A110D

HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)
standard by JEDEC Solid State Technology Association, 11/01/2010

JEDEC JESD28-A

A PROCEDURE FOR MEASURING N-CHANNEL MOSFET HOT-CARRIER-INDUCED DEGRADATION UNDER DC STRESS
standard by JEDEC Solid State Technology Association, 12/01/2001