JEDEC JESD90
A PROCEDURE FOR MEASURING P-CHANNEL MOSFET NEGATIVE BIAS TEMPERATURE INSTABILITIES
standard by JEDEC Solid State Technology Association, 11/01/2004
JEDEC JESD245C
Byte Addressable Energy Backed Interface
standard by JEDEC Solid State Technology Association, 09/01/2019
JEDEC JESD57
TEST PROCEDURE FOR THE MANAGEMENT OF SINGLE-EVENT EFFECTS IN SEMICONDUCTOR DEVICES FROM HEAVY ION IRRADIATION
standard by JEDEC Solid State Technology Association, 12/01/1996
JEDEC JESD49A (R2009)
PROCUREMENT STANDARD FOR KNOWN GOOD DIE (KGD)
standard by JEDEC Solid State Technology Association, 09/01/2005
JEDEC JESD16-A (R2008)
ASSESSMENT OF AVERAGE OUTGOING QUALITY LEVELS IN PARTS PER MILLION (PPM)
standard by JEDEC Solid State Technology Association, 04/01/1995
JEDEC JS709A
JOINT JEDEC/ECA STANDARD, DEFINING "LOW-HALOGEN" PASSIVES AND SOLID STATE DEVICES (Removal of BFR/CFR/PVC)
standard by JEDEC Solid State Technology Association, 05/01/2012
JEDEC JESD659B
FAILURE-MECHANISM-DRIVEN RELIABILITY MONITORING
standard by JEDEC Solid State Technology Association, 02/01/2007
JEDEC JESD82-31
DDR4 REGISTER CLOCK DRIVER (DDR4RCD01)
standard by JEDEC Solid State Technology Association, 08/01/2016
JEDEC JESD22-A110D
HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)
standard by JEDEC Solid State Technology Association, 11/01/2010
JEDEC JESD28-A
A PROCEDURE FOR MEASURING N-CHANNEL MOSFET HOT-CARRIER-INDUCED DEGRADATION UNDER DC STRESS
standard by JEDEC Solid State Technology Association, 12/01/2001
JEDEC JESD84-C43
EMBEDDED MULTIMEDIACARD (e*MMC)MECHANICAL STANDARD
standard by JEDEC Solid State Technology Association, 12/01/2007
JEDEC JESD8-22B
HSUL_12 LPDDR2 and LPDDR3 I/O with Optional ODT
standard by JEDEC Solid State Technology Association, 04/01/2014