JEDEC JESD22-A102C (R2008)
ACCELERATED MOISTURE RESISTANCE – UNBIASED AUTOCLAVE
standard by JEDEC Solid State Technology Association, 12/01/2000
NACE ASAE-ASABE B11 CGA ICC CTA
ACCELERATED MOISTURE RESISTANCE – UNBIASED AUTOCLAVE
standard by JEDEC Solid State Technology Association, 12/01/2000
Low Power Double Data Rate 2 (LPDDR2)
standard by JEDEC Solid State Technology Association, 04/01/2011
HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)
standard by JEDEC Solid State Technology Association, 01/01/2009
TEST BOARDS FOR AREA ARRAY SURFACE MOUNT PACKAGE THERMAL MEASUREMENTS
standard by JEDEC Solid State Technology Association, 07/01/2000
VIBRATION, VARIABLE FREQUENCY
standard by JEDEC Solid State Technology Association, 09/01/2016
STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
standard by JEDEC Solid State Technology Association, 02/01/2011
RELATIVE SPECTRAL RESPONSE CURVES FOR SEMICONDUCTOR INFRARED DETECTORS
standard by JEDEC Solid State Technology Association, 10/01/1969
Embedded Multi-media card (e*MMC), Electrical Standard 4.51
standard by JEDEC Solid State Technology Association, 06/01/2012
THERMAL TEST CHIP GUIDELINE (WIRE BOND TYPE CHIP)
standard by JEDEC Solid State Technology Association, 02/01/1997
Byte Addressable Energy Backed Interface
standard by JEDEC Solid State Technology Association, 12/01/2015
Lead Integrity
standard by JEDEC Solid State Technology Association, 07/01/2011
STUB SERIES TERMINATED LOGIC FOR 1.8 V (SSTL_18)
standard by JEDEC Solid State Technology Association, 09/01/2003