JEDEC JESD47J
STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
standard by JEDEC Solid State Technology Association, 08/01/2017
JEDEC JESD220B
Universal Flash Storage (UFS)
standard by JEDEC Solid State Technology Association, 09/01/2013
JEDEC JESD659C
FAILURE-MECHANISM-DRIVEN RELIABILITY MONITORING
standard by JEDEC Solid State Technology Association, 04/01/2017
JEDEC JESD8-14A.01
1.0 V +/- 0.1 V (NORMAL RANGE) AND 0.7 V – 1.1 V (WIDE RANGE) POWER SUPPLY VOLTAGE AND INTERFACE STANDARD FOR NONTERMINATED DIGITAL INTEGRATED CIRCUITS
standard by JEDEC Solid State Technology Association, 09/01/2007
JEDEC JESD30F
Descriptive Designation System for Semiconductor-device Packages
standard by JEDEC Solid State Technology Association, 04/01/2013
JEDEC JEP 148A
RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENT
standard by JEDEC Solid State Technology Association, 12/01/2008
JEDEC JESD22-A122A
Power Cycling
standard by JEDEC Solid State Technology Association, 06/01/2016
JEDEC JESD79-3F
DDR3 SDRAM Specification
standard by JEDEC Solid State Technology Association, 07/01/2012
JEDEC JESD246
Customer Notification Process for Disasters
standard by JEDEC Solid State Technology Association, 01/01/2014
JEDEC JESD22-A110E
HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)
standard by JEDEC Solid State Technology Association, 07/01/2015
JEDEC EIA 557B
STATISTICAL PROCESS CONTROL SYSTEMS
standard by JEDEC Solid State Technology Association, 02/01/2006
JEDEC JESD2
DIGITAL BIPOLAR LOGIC PINOUTS FOR CHIP CARRIERS
standard by JEDEC Solid State Technology Association, 12/01/1982