JEDEC JESD235
HIGH BANDWIDTH MEMORY (HBM) DRAM
standard by JEDEC Solid State Technology Association, 10/01/2013
JEDEC JESD22-B110B.01
Mechanical Shock – Device and Subassembly
standard by JEDEC Solid State Technology Association, 06/01/2019
JEDEC JEP134
GUIDELINES FOR PREPARING CUSTOMER-SUPPLIED BACKGROUND INFORMATION RELATING TO A SEMICONDUCTOR-DEVICE FAILURE ANALYSIS
standard by JEDEC Solid State Technology Association, 09/01/1998
JEDEC JESD 22-B110A (R2009)
SUBASSEMBLY MECHANICAL SHOCK
standard by JEDEC Solid State Technology Association, 11/01/2004
JEDEC JESD50B.01
SPECIAL REQUIREMENTS FOR MAVERICK PRODUCT ELIMINATION AND OUTLIER MANAGEMENT
standard by JEDEC Solid State Technology Association, 11/01/2008
JEDEC JESD 22-B105C (R2006)
LEAD INTEGRITY
standard by JEDEC Solid State Technology Association, 05/01/2003
JEDEC JEP115 (R1999)
POWER MOSFET ELECTRICAL DOSE RATE TEST METHOD
standard by JEDEC Solid State Technology Association, 08/01/1989
JEDEC JESD89A
MEASUREMENT AND REPORTING OF ALPHA PARTICLE AND TERRESTRIAL COSMIC RAY INDUCED SOFT ERRORS IN SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 10/01/2006
JEDEC JESD79-3-2
Addendum No. 2 to JESD79-3 – 1.35 V DDR3L-800, DDR3L-1066, DDR3L-1333, and DDR3L-1600
Amendment by JEDEC Solid State Technology Association, 10/01/2011
JEDEC JESD15-4
DELPHI COMPACT THERMAL MODEL GUIDELINE
standard by JEDEC Solid State Technology Association, 10/01/2008
JEDEC J-STD-035
JOINT IPC/JEDEC STANDARD FOR ACOUSTIC MICROSCOPY FOR NONHERMETRIC ENCAPSULATED ELECTRONIC COMPONENTS
standard by JEDEC Solid State Technology Association, 05/01/1999
JEDEC JEP001-1A
FOUNDRY PROCESS QUALIFICATION GUIDELINES – BACKEND OF LINE (Wafer Fabrication Manufacturing Sites)
standard by JEDEC Solid State Technology Association, 09/01/2018