JEDEC JESD12
SEMICUSTOM INTEGRATED CIRCUITS (FORMERLY PUBLISHED AS STANDARD FOR GATE ARRAY BENCHMARK SET)
standard by JEDEC Solid State Technology Association, 06/01/1985
NACE ASAE-ASABE B11 CGA ICC CTA
SEMICUSTOM INTEGRATED CIRCUITS (FORMERLY PUBLISHED AS STANDARD FOR GATE ARRAY BENCHMARK SET)
standard by JEDEC Solid State Technology Association, 06/01/1985
ADDENDUM No. 9 to JESD24 – SHORT CIRCUIT WITHSTAND TIME TEST METHOD
Amendment by JEDEC Solid State Technology Association, 08/01/1992
GUIDELINES FOR GaAs MMIC AND FET LIFE TESTING
standard by JEDEC Solid State Technology Association, 12/01/2018
SERIAL FLASH DISCOVERABLE PARAMETERS (SFDP)
standard by JEDEC Solid State Technology Association,
TERMINOLOGY AND METHODS OF MEASUREMENT FOR BISTABLE SEMICONDUCTOR MICROCIRCUITS
standard by JEDEC Solid State Technology Association, 11/01/1969
STANDARD TEST METHOD UTILIZING X-RAY FLUORESCENCE (XRF) FOR ANALYZING COMPONENT FINISHES AND SOLDER ALLOYS TO DETERMINE TIN (Sn) – LEAD (Pb) CONTENT
standard by JEDEC Solid State Technology Association, 04/01/2017
Master Trace for 128 GB SSD
Directive by JEDEC Solid State Technology Association, 07/01/2012
INSTRUMENTATION CHIP DATA SHEET FOR FBDIMM DIAGNOSTIC SENSELINES
standard by JEDEC Solid State Technology Association, 11/01/2006
STANDARD FOR THE MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERS
standard by JEDEC Solid State Technology Association, 04/01/1976
MECHANICAL COMPRESSIVE STATIC STRESS TEST METHODS
standard by JEDEC Solid State Technology Association, 10/01/2018
RECOMMENDED CHARACTERIZATION OF MOS SHIFT REGISTERS
standard by JEDEC Solid State Technology Association, 11/01/1972
GUIDELINE FOR RESIDUAL GAS ANALYSIS (RGA) FOR MICROELECTRONIC PACKAGES
standard by JEDEC Solid State Technology Association, 11/01/2011