JEDEC JEP166

JC-42.6 MANUFACTURER IDENTIFICATION (ID) CODE FOR LOW POWER MEMORIES
standard by JEDEC Solid State Technology Association, 03/01/2014

JEDEC JESD 46C

CUSTOMER NOTIFICATION OF PRODUCT/PROCESS CHANGES BY SEMICONDUCTOR SUPPLIERS
standard by JEDEC Solid State Technology Association, 10/01/2006

JEDEC JESD68.01

COMMON FLASH INTERFACE (CFI)
standard by JEDEC Solid State Technology Association, 09/01/2003

JEDEC JESD20

STANDARD FOR DESCRIPTION OF 54/74ACXXXXX AND 54/74ACTXXXXX ADVANCED HIGH-SPEED CMOS DEVICES
standard by JEDEC Solid State Technology Association, 09/01/1990

JEDEC JESD8-19

POD18 – 1.8 V Pseudo Open Drain I/O
standard by JEDEC Solid State Technology Association, 12/01/2006

JEDEC JESD230

NAND Flash Interface Interoperability
standard by JEDEC Solid State Technology Association, 10/01/2012

JEDEC JESD 82-28A

FULLY BUFFERED DIMM DESIGN FOR TEST, DESIGN FOR VALIDATION (DFx)
standard by JEDEC Solid State Technology Association, 07/01/2008

JEDEC JESD76-3

STANDARD DESCRIPTION OF 1.5 V CMOS LOGIC DEVICES
standard by JEDEC Solid State Technology Association, 08/01/2001

JEDEC JEP140 (R2006)

BEADED THERMOCOUPLE TEMPERATURE MEASUREMENT OF SEMICONDUCTOR PACKAGES
standard by JEDEC Solid State Technology Association, 06/01/2002

JEDEC JEP 79

LIFE TEST METHODS FOR PHOTOCONDUCTIVE CELLS
standard by JEDEC Solid State Technology Association, 09/01/1969

JEDEC JESD51-6

INTEGRATED CIRCUIT THERMAL TEST METHOD ENVIRONMENTAL CONDITIONS – FORCED CONVECTION (MOVING AIR)
standard by JEDEC Solid State Technology Association, 03/01/1999