NACE ASAE-ASABE B11 CGA ICC CTA
Electrical equipment for measurement, control and laboratory use – EMC requirements – Part 2-6: Particular requirements – In vitro diagnostic (IVD) medical equipment
standard by International Electrotechnical Commission, 10/28/2020
Amendment 2 – Semiconductor devices – Part 16-4: Microwave integrated circuits – Switches
Amendment by International Electrotechnical Commission, 08/16/2017
Lighting equipment – Non-active mode power measurement
standard by International Electrotechnical Commission, 07/22/2020
Amendment 2 – Medical electrical equipment – Part 1-9: General requirements for basic safety and essential performance – Collateral Standard: Requirements for environmentally conscious design
Amendment by International Electrotechnical Commission, 07/22/2020
Application integration at electric utilities – System interfaces for distribution management – Part 5: Distributed energy optimization
standard by International Electrotechnical Commission, 08/18/2020
Electric motor-operated hand-held tools, transportable tools and lawn and garden machinery – Safety – Part 2-6: Particular requirements for hand-held hammers
standard by International Electrotechnical Commission, 07/27/2020
Semiconductor devices – Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) – Part 1: Fast BTI test for MOSFET
standard by International Electrotechnical Commission, 07/15/2020
Charging cables for electric vehicles for rated voltages up to and including 0,6/1 kV – Part 1: General requirements CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 11/06/2020
Amendment 1 – Fibre optic interconnecting devices and passive components – Performance standard – Part 1: General and guidance
Amendment by International Electrotechnical Commission, 06/24/2020
Industrial communication networks – Fieldbus specifications – Part 5-26: Application layer service definition – Type 26 elements
standard by International Electrotechnical Commission, 04/18/2019
Corrigendum 1 – EMC IC modelling – Part 1: General modelling framework
Corrigenda by International Electrotechnical Commission, 07/10/2020
Semiconductor devices – Mechanical and climatic test methods – Part 41: Standard reliability testing methods of non-volatile memory devices
standard by International Electrotechnical Commission, 07/22/2020