IEC 61557-4 Ed. 3.0 b:2019

Electrical safety in low voltage distribution systems up to 1 000 V a.c. and 1 500 V d.c. – Equipment for testing, measuring or monitoring of protective measures – Part 4: Resistance of earth connection and equipotential bonding
standard by International Electrotechnical Commission, 07/26/2019

IEC 62052-11 Amd.1 Ed. 1.0 b:2016

Amendment 1 – Electricity metering equipment (a.c.) – General requirements, tests and test conditions – Part 11: Metering equipment
Amendment by International Electrotechnical Commission, 11/22/2016

IEC 61326-2-6 Ed. 1.0 b CORR1:2007

Corrigendum 1 – Electrical equipment for measurement, control and laboratory use – EMC requirements – Part 2-6: Particular requirements – In vitro diagnostic (IVD) medical equipment
Corrigenda by International Electrotechnical Commission, 09/25/2007

IEC 61559-1 Ed. 1.0 b:2009

Radiation protection instrumentation in nuclear facilities – Centralized systems for continuous monitoring of radiation and/or levels of radioactivity – Part 1: General requirements
standard by International Electrotechnical Commission, 05/26/2009

IEC 61977 Ed. 3.0 b:2015

Fibre optic interconnecting devices and passive components – Fibre optic filters – Generic specification
standard by International Electrotechnical Commission, 08/28/2015

IEC 61788-3 Ed. 1.0 en:2000

Superconductivity – Part 3: Critical current measurement – DC critical current of Ag-sheathed Bi-2212 and Bi-2223 oxide superconductors
standard by International Electrotechnical Commission, 12/14/2000

IEC 61319-2 Ed. 1.0 b:1997

Interconnections of satellite receiving equipment – Part 2: Japan
standard by International Electrotechnical Commission, 04/23/1997

IEC 62047-8 Ed. 1.0 b:2011

Semiconductor devices – Micro-electromechanical devices – Part 8: Strip bending test method for tensile property measurement of thin films
standard by International Electrotechnical Commission, 03/14/2011

IEC 62040-3 Ed. 2.0 b CORR1:2011

Corrigendum 1 – Uninterruptible power systems (UPS) – Part 3: Method of specifying the performance and test requirements
Corrigenda by International Electrotechnical Commission, 09/13/2011

IEC 61428 Ed. 1.0 b:1998

Nuclear instrumentation – Sample containers for gamma-ray spectrometry with Ge-detectors
standard by International Electrotechnical Commission, 05/15/1998

IEC 62047-25 Ed. 1.0 b:2016

Semiconductor devices – Micro-electromechanical devices – Part 25: Silicon based MEMS fabrication technology – Measurement method of pull-press and shearing strength of micro bonding area
standard by International Electrotechnical Commission, 08/29/2016

IEC 62012-1 Ed. 1.0 b:2004

Multicore and symmetrical pair/quad cables for digital communications to be used in harsh environments – Part 1: Generic specification
standard by International Electrotechnical Commission, 02/17/2004