BS PD ES 59008-2:1999
Data requirements for semiconductor die. Vocabulary
standard by BSI Group, 12/15/1999
BS PD CLC/TR 62453-61:2009
Field device tool interface (FDT) specification. Device type manager (DTM). Styleguide for common object model
standard by BSI Group, 01/31/2010
BS PD CLC/TR 62258-4:2013
Semiconductor die products. Questionnaire for die users and suppliers
standard by BSI Group, 11/30/2014
BS PD EN 14035-4:2003
Fireworks. Bangers and banger batteries. Specification and test methods
standard by BSI Group, 08/08/2003
BS PD CR 1752:1999
Ventilation for buildings. Design criteria for the indoor environment
standard by BSI Group, 04/15/1999
BS PD CLC/TR 61340-5-2:2008
Electrostatics. Protection of electronic devices from electrostatic phenomena. User guide
standard by BSI Group, 05/30/2008
BS PD CR 13933:2000
Masonry cement. Testing for workability (cohesivity)
standard by BSI Group, 07/15/2001
BS PD ES 59008-1:2000
Data requirements for semiconductor die. General requirements
standard by BSI Group, 01/15/2000
BS PD IEC TR 60909-1:2002
Short-circuit currents in three-phase a.c. systems. Factors for the calculation of short-circuit currents according to IEC 60909-0
standard by BSI Group, 10/11/2002
BS PD IEC TR 61948-4:2019
Nuclear medicine instrumentation. Routine tests. Radionuclide calibrators
standard by BSI Group, 03/28/2019
BS PD IEC GUIDE 119:2017
Preparation of energy efficiency publications and the use of basic energy efficiency publications and group energy efficiency publications
standard by BSI Group, 04/30/2017
BS PD IEC TR 61948-2:2019
Nuclear medicine instrumentation. Routine tests
standard by BSI Group, 08/29/2019